采用0.18μm技术实现非易失性4×4 4T1D DRAM单元

T. Joseph, Ajith Ravindran
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引用次数: 1

摘要

本文讨论了不同4×4位DRAM单元的设计和发展。比较了不同挥发性4×4 DRAM电池的性能。从功率、面积和时延三个方面进行了比较。提出了4×4非易失性(NVDRAM 4T1D)单元。然后检查NVDRAM的性能。原理图入口使用Mentor Graphics Design architect完成,仿真使用Mentor Graphics Eldo完成。仿真结果采用TSMC 0.18μm工艺在1.8V下得到。
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Implementation of non-volatile 4×4 4T1D DRAM cell in 0.18μm technology
This paper deals with the design and evolution of different 4×4 bit DRAM cells. Performances of different volatile 4×4 DRAM cells are compared. The comparison is done on the basis of power, area and delay. The 4×4 Non-Volatile (NVDRAM 4T1D) cell is proposed. The performance of the NVDRAM is then examined. The schematic entry was done using Mentor Graphics Design architect and simulations are done using Mentor Graphics Eldo. The simulation results obtained with TSMC 0.18μm process technology at 1.8V.
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