如何用半导体测试方法从一开始就保证零缺陷

Bernd Gessner
{"title":"如何用半导体测试方法从一开始就保证零缺陷","authors":"Bernd Gessner","doi":"10.1109/TEST.2007.4437697","DOIUrl":null,"url":null,"abstract":"Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"How to ensure zero defects from the beginning with semiconductor test methods\",\"authors\":\"Bernd Gessner\",\"doi\":\"10.1109/TEST.2007.4437697\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2007.4437697\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2007.4437697","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

如今,电子产品的可靠性被认为是确保其功能安全可靠的最低要求。从半导体行业来看,作为高集成电路的供应商,这一趋势的主要挑战之一是确保产品的可靠性,但更要准确地预测那些产品的可靠性。奥地利微系统公司很早就认识到这一趋势,并在从设计到产品寿命结束的所有过程步骤中实施了零缺陷计划。本文综述了零缺陷程序的研究现状,介绍了零缺陷程序的研究成果和实现方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
How to ensure zero defects from the beginning with semiconductor test methods
Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Csirmaz's Duality Conjecture and Threshold Secret Sharing Online Mergers and Applications to Registration-Based Encryption and Accumulators Exponential Correlated Randomness Is Necessary in Communication-Optimal Perfectly Secure Two-Party Computation The Cost of Statistical Security in Proofs for Repeated Squaring Tight Estimate of the Local Leakage Resilience of the Additive Secret-Sharing Scheme & Its Consequences
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1