分类集成电路产业中的标准、互操作性和创新

K. Chakrabarty
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引用次数: 1

摘要

当今的集成电路产业分为集成器件制造商(idm)、代工厂、芯片公司和系统解决方案实体。然而,随着我们转向更先进的技术节点,并探索新的设计范式(如3D集成),系统的复杂性仍在不断增长。为了能够在可预测的时间内产生工作设计,我们需要将设计和测试数据生成、交换、翻译并最终由人类和计算机分析的机制标准化。电子设计自动化(EDA)社区由许多标准组织提供服务,例如IEEE、Accellera、OSCI、Si2和CMC,它们都关注设计和测试的不同方面。标准还通过提供评估新想法和比较各种新兴EDA解决方案的方法,鼓励学术界的研究突破。这篇引人入胜的文章向D&T的读者介绍了今天和即将到来的EDA标准,因为我们正朝着低于20纳米的特征尺寸迈进。客座编辑Shishpal Rawat和Sumit DasGupta做了一项值得称赞的工作,他们主动将这期特刊与一系列精选文章结合在一起,其中包括来自这个生态系统中各个实体(idm, EDA公司等)以及大学的专家的贡献。这些文章涵盖了研究进展、实践经验和对未来趋势的看法。该特刊涵盖了系统仿真、功率建模和低功耗设计、硬件设计中的抽象、SystemC和SystemVerilog以及测试和可测试性设计。读者还可以找到我们定期的Last Byte专栏,该专栏关注没有EDA标准的世界将会是什么样子,而标准专栏则提供正在进行的IEEE P1687活动的更新,以扩展当前版本的IEEE 1149.1。嵌入式测试仪器和对这些测试能力的访问与今天的芯片和系统(3D堆叠、更高的集成、异构系统等等)高度相关。本期还包括对两本关于自动化在当今社会中的作用的书籍的回顾,特别是在EDA工具及其对创新、就业创造(或消失)和技术加速的影响的背景下。我感谢Shishpal和Sumit担任特刊的客座编辑,感谢作者们的贡献,感谢审稿人们的勤奋和严格遵守严格的审稿时间表。我还要感谢专栏编辑们的贡献。我希望你会喜欢阅读这一期特刊,以及2012年改版后的D&T后续的几期。我们已经为2012年的剩余时间整理了一系列令人兴奋的特刊,现在我们正在为2013年的特刊做准备。欢迎D&T读者的意见和参与!
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Standards, Interoperability, and Innovation in a Disaggregated IC Industry
h THE IC INDUSTRY today is disaggregated into integrated device manufacturers (IDMs), foundries, fables companies, and systems solution entities. Yet system complexity continues to grow relentlessly as we move to more advanced technology nodes and explore new design paradigms such as 3D integration. In order to be able to produce working designs in a predictable amount of time, we need to standardize the mechanism by which design and test data are generated, exchanged, translated, and ultimately analyzed by humans and computers. The electronic design automation (EDA) community is served by many standards bodies such as IEEE, Accellera, OSCI, Si2, and CMC, all of which focus on different aspects of design and test. Standards also encourage research breakthroughs in academia by providing the means for evaluating new ideas and comparing various emerging EDA solutions with each other. This fascinating issue introduces D&T readers to today’s and forthcoming EDA standards as we move towards sub-20 nm feature sizes. Guest Editors Shishpal Rawat and Sumit DasGupta have done a commendable job in taking the initiative and putting together this special issue with a set of selected articles, which include contributions by experts from various entities in this ecosystem (IDMs, EDA companies, etc.) as well as universities. These articles cover the landscape of research advances, practical experiences, and perspectives on future trends. The special issue covers system simulation, power modeling and low-power design, abstractions in hardware design, SystemC and SystemVerilog, and test and design-for-testability. Readers will also find our regular Last Byte column that looks at how our world will be without EDA standards, and the Standards column that provides an update on ongoing IEEE P1687 activities to extend the current version of IEEE 1149.1. Embedded test instruments and access to these test capabilities is highly relevant for today’s chips and systems (3D stacking, higher integration, heterogeneous systems, and so on). This issue also includes a review of two books on the role of automation in our society today, especially in the context of EDA tools and their impact on innovation, job creation (or disappearance), and technology acceleration. I thank Shishpal and Sumit for serving as Guest Editors of the special issue, the authors for their contributions, and the reviewers for their diligence and adherence to an extremely tight review schedule. I also thank the column editors for their contributions. I hope you will enjoy reading this special issue, as well as the subsequent issues of the revamped D&T in 2012. We have lined up an exciting set of special issues for the remainder of 2012 and we are now preparing the lineups for 2013. Inputs and participation from the D&T readership are always welcome!
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IEEE Design & Test of Computers
IEEE Design & Test of Computers 工程技术-工程:电子与电气
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