{"title":"基于直流局部放电的高压存储电容器典型缺陷模式识别","authors":"Guangning Wu, Shanshan Bian, Liren Zhou, Xueqin Zhang, Hanzheng Ran, Chenglong Yu","doi":"10.1007/S11431-009-0380-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"23 1","pages":"3729-3735"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge\",\"authors\":\"Guangning Wu, Shanshan Bian, Liren Zhou, Xueqin Zhang, Hanzheng Ran, Chenglong Yu\",\"doi\":\"10.1007/S11431-009-0380-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":49125,\"journal\":{\"name\":\"Science in China. Series E, Technological Sciences\",\"volume\":\"23 1\",\"pages\":\"3729-3735\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Science in China. Series E, Technological Sciences\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/S11431-009-0380-1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Science in China. Series E, Technological Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S11431-009-0380-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}