有RSD循环A/D转换器的虚拟测试经验

M. Kubar, O. Subrt, P. Martínek, J. Jakovenko
{"title":"有RSD循环A/D转换器的虚拟测试经验","authors":"M. Kubar, O. Subrt, P. Martínek, J. Jakovenko","doi":"10.1109/DDECS.2009.5012123","DOIUrl":null,"url":null,"abstract":"This paper deals with the ADC non-linearity extraction using a newly developed Virtual Testing Environment (VTE). The VTE proposed is built on Verilog-A implementation of the Servo-Loop unit fully integrated into Cadence design environment. The Servo-Loop method used is aimed at the nonlinearity extraction of static ADC transfer curve; in this paper, we prove an advanced Servo-Loop version focusing on behavioral and transistor-level example of the Residual Signed Digit (RSD) cyclic A/D converter design. Powerful capabilities of the proposed VTE were successfully confirmed by a large set of behavioral and transistor-level simulations in Spectre.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Experience in Virtual Testing of RSD cyclic A/D converters\",\"authors\":\"M. Kubar, O. Subrt, P. Martínek, J. Jakovenko\",\"doi\":\"10.1109/DDECS.2009.5012123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the ADC non-linearity extraction using a newly developed Virtual Testing Environment (VTE). The VTE proposed is built on Verilog-A implementation of the Servo-Loop unit fully integrated into Cadence design environment. The Servo-Loop method used is aimed at the nonlinearity extraction of static ADC transfer curve; in this paper, we prove an advanced Servo-Loop version focusing on behavioral and transistor-level example of the Residual Signed Digit (RSD) cyclic A/D converter design. Powerful capabilities of the proposed VTE were successfully confirmed by a large set of behavioral and transistor-level simulations in Spectre.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文研究了利用新开发的虚拟测试环境(VTE)提取ADC非线性的方法。所提出的VTE是基于Verilog-A实现的伺服回路单元,完全集成到Cadence设计环境中。所采用的伺服环方法是针对静态ADC传递曲线的非线性提取;在本文中,我们证明了一个先进的伺服回路版本,重点关注残差有符号数字(RSD)循环A/D转换器设计的行为和晶体管级示例。在Spectre中进行了大量的行为和晶体管级模拟,成功地证实了所提出的VTE的强大功能。
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Experience in Virtual Testing of RSD cyclic A/D converters
This paper deals with the ADC non-linearity extraction using a newly developed Virtual Testing Environment (VTE). The VTE proposed is built on Verilog-A implementation of the Servo-Loop unit fully integrated into Cadence design environment. The Servo-Loop method used is aimed at the nonlinearity extraction of static ADC transfer curve; in this paper, we prove an advanced Servo-Loop version focusing on behavioral and transistor-level example of the Residual Signed Digit (RSD) cyclic A/D converter design. Powerful capabilities of the proposed VTE were successfully confirmed by a large set of behavioral and transistor-level simulations in Spectre.
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