{"title":"超出绿灯范围的测试","authors":"Bob Klosterboer","doi":"10.1109/TEST.2017.8242025","DOIUrl":null,"url":null,"abstract":"This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test, but potentially on the entire design and manufacturing ecosystem. I will also explore some of the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"100 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing beyond the green light\",\"authors\":\"Bob Klosterboer\",\"doi\":\"10.1109/TEST.2017.8242025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test, but potentially on the entire design and manufacturing ecosystem. I will also explore some of the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"100 1\",\"pages\":\"1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2017.8242025\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2017.8242025","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test, but potentially on the entire design and manufacturing ecosystem. I will also explore some of the value tradeoffs of increased data harvesting vs. reduced test cost requirements of each component.