基于修正耦合应力理论的钳形原子力显微镜悬臂梁灵敏度分析

IF 1.2 Q4 NANOSCIENCE & NANOTECHNOLOGY international journal of nano dimension Pub Date : 2016-01-01 DOI:10.7508/IJND.2016.01.006
M. Abbasi, Nooshin Abbasi
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引用次数: 8

摘要

摘要建立了基于修正耦合应力理论的原子力显微镜(AFM)弯曲灵敏度关系式,研究了组合悬臂探针(ACP)的弯曲灵敏度。该ACP包括一个水平悬臂,两个垂直延伸和位于延伸自由端的两个尖端,形成一个卡钳。利用瑞利-里兹方法得到了弯曲振动问题的近似解。结果表明,在较低的接触刚度下,修正耦合应力理论计算的AFM ACP灵敏度小于经典梁理论计算的灵敏度。结果还表明,当悬臂梁的厚度接近材料长度尺度时,特别是在较低的接触刚度时,所提出的ACP的弯曲灵敏度具有很强的尺寸依赖性。此外,当系统接触刚度较小时,悬臂梁厚度与材料长度尺度的比值和垂直延伸之间的距离也较小,此时系统的弯曲模态灵敏度最大。在这种情况下,垂直延伸与悬臂的夹紧端之间的距离以及垂直延伸的长度都很大。结果表明,右侧壁尖端的灵敏度高于左侧壁尖端。
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SENSITIVITY ANALYSIS OF A CALIPER FORMED ATOMIC FORCE MICROSCOPE CANTILEVER BASED ON A MODIFIED COUPLE STRESS THEORY
ABS TRACT: A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions, which forming a caliper. An approximate solution to the flexural vibration problem is obtained using the Rayleigh–Ritz method. The results show that the sensitivities of AFM ACP obtained by the modified couple stress theory are smaller than those evaluated by the classical beam theory at the lower contact stiffness. The results also indicate that the flexural sensitivities of the proposed ACP are strong size dependant when the thickness of the cantilever is close to the material length scale, especially at lower contact stiffness. Furthermore, the greatest flexural modal sensitivity occurs at a small contact stiffness of the system, in which the ratio of the cantilever thickness to the material length scale and the distance between the vertical extensions are also small. In this situation, the distance between the vertical extensions and the clamped end of the cantilever and also the vertical extensions lengths are large. The results reveal that the sensitivity of the right sidewall tip is higher than that of the left one.
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来源期刊
international journal of nano dimension
international journal of nano dimension NANOSCIENCE & NANOTECHNOLOGY-
CiteScore
2.80
自引率
20.00%
发文量
0
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