{"title":"基于宽频照相术的脉冲光束测量","authors":"D. Goldberger, J. Barolak, C. Durfee, D. Adams","doi":"10.1364/FIO.2020.FTH5A.4","DOIUrl":null,"url":null,"abstract":"We demonstrate full spatiospectral, pulse-beam metrology via Broadband Ptychography. The technique reconstructs the complex field of multiple spectral components of probe illumination from a modelocked Ti:sapphire laser.","PeriodicalId":91683,"journal":{"name":"Frontiers in optics. Annual Meeting of the Optical Society of America","volume":"35 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Pulsed-beam Metrology via Broadband Ptychography\",\"authors\":\"D. Goldberger, J. Barolak, C. Durfee, D. Adams\",\"doi\":\"10.1364/FIO.2020.FTH5A.4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate full spatiospectral, pulse-beam metrology via Broadband Ptychography. The technique reconstructs the complex field of multiple spectral components of probe illumination from a modelocked Ti:sapphire laser.\",\"PeriodicalId\":91683,\"journal\":{\"name\":\"Frontiers in optics. Annual Meeting of the Optical Society of America\",\"volume\":\"35 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Frontiers in optics. Annual Meeting of the Optical Society of America\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/FIO.2020.FTH5A.4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frontiers in optics. Annual Meeting of the Optical Society of America","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/FIO.2020.FTH5A.4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We demonstrate full spatiospectral, pulse-beam metrology via Broadband Ptychography. The technique reconstructs the complex field of multiple spectral components of probe illumination from a modelocked Ti:sapphire laser.
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