{"title":"无损检测中的数字信号处理","authors":"B. Georgel","doi":"10.1016/B978-0-444-89791-6.50063-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100962,"journal":{"name":"Non-Destructive Testing","volume":"19 1","pages":"283-287"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Digital Signal Processing for NDT\",\"authors\":\"B. Georgel\",\"doi\":\"10.1016/B978-0-444-89791-6.50063-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100962,\"journal\":{\"name\":\"Non-Destructive Testing\",\"volume\":\"19 1\",\"pages\":\"283-287\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Non-Destructive Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/B978-0-444-89791-6.50063-9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Non-Destructive Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-444-89791-6.50063-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3