{"title":"汽车主题演讲:看，妈妈!没有手!","authors":"J. Kunkel","doi":"10.1109/TEST.2017.8242027","DOIUrl":null,"url":null,"abstract":"After many years of relying on established processes technology geometries, advanced automotive semiconductors, driven by assisted and autonomous driving systems, have recently joined the race to ever smaller semiconductor process technologies. If the massive functionality enabled by 16-nm and below FinFET semiconductor processes, combined with the new fault mechanisms they bring along, weren't enough of a test and repair challenge, the automotive functional safety requirements add a whole other dimension to the problem. This talk discusses automotive test and repair requirements and solutions in the context of automotive functional safety from the perspective of a test automation tool and IP provider.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"89 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Automotive keynote: Look Mom! No hands!\",\"authors\":\"J. Kunkel\",\"doi\":\"10.1109/TEST.2017.8242027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"After many years of relying on established processes technology geometries, advanced automotive semiconductors, driven by assisted and autonomous driving systems, have recently joined the race to ever smaller semiconductor process technologies. If the massive functionality enabled by 16-nm and below FinFET semiconductor processes, combined with the new fault mechanisms they bring along, weren't enough of a test and repair challenge, the automotive functional safety requirements add a whole other dimension to the problem. This talk discusses automotive test and repair requirements and solutions in the context of automotive functional safety from the perspective of a test automation tool and IP provider.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"89 1\",\"pages\":\"1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2017.8242027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2017.8242027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
After many years of relying on established processes technology geometries, advanced automotive semiconductors, driven by assisted and autonomous driving systems, have recently joined the race to ever smaller semiconductor process technologies. If the massive functionality enabled by 16-nm and below FinFET semiconductor processes, combined with the new fault mechanisms they bring along, weren't enough of a test and repair challenge, the automotive functional safety requirements add a whole other dimension to the problem. This talk discusses automotive test and repair requirements and solutions in the context of automotive functional safety from the perspective of a test automation tool and IP provider.
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