表面粗糙度与新接触方法的测量

Bogdan Nowicki
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引用次数: 6

摘要

为了获得高质量的产品,需要对材料性能进行测试,对表面几何形状的尺寸和误差进行测量。表面粗糙度评价的发展依赖于廉价和易于使用的测量仪器的引进。最常用的触控式设备结构复杂,价格昂贵,需要高素质的质量控制人员或工人来操作。另一方面,光学和气动方法由于其对干扰的敏感性和较大的测量误差,到目前为止不太常用。华沙技术大学机械技术研究所进行了研究,开发了用于直接在工作台上测量表面粗糙度的简单装置。到目前为止,已有两种接触方法,测量元件的运动限制在与被测表面正交的方向上。第一种是间接方法,利用粗糙表面的相互渗透效应,可以构造非常简单的测量装置,其测量误差可达20%。另一种是直接的粗糙度找平深度(Rp)测量方法,可以构造精度更高的测量装置。
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Surface roughness and measurement with new contact methods

To obtain high-quality products requires, among others, testing of material properties and measurements of dimensions and errors of surface geometry. The development of surface roughness evaluation depends on the introduction of cheap and easily-applied measuring instruments. The most commonly used stylus-type devices are of complicated construction, expensive and require highly qualified quality control personnel or workers to operate. On the other hand, optical and pneumatic methods are, due to their sensitivity to disturbances and large measuring errors, by far less commonly used. Investigations are conducted in the Institute of Mechanical Technology at the Technical University of Warsaw on the development of methods to construct simple devices designed for measuring the surface roughness directly on the work-stand. Until now two contact methods have been developed with measuring elements movement restricted to the orthogonal direction in relation to the surface measured. The first one is an indirect method using the effect of interpenetration of rough surfaces and enables very simple measuring devices to be constructed, their measuring error reaching up to 20 per cent. The other one is a direct method of roughness levelling depth (Rp) measurement and enables measuring devices of much higher accuracy to be built.

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