CuInGaTe2的合成及其电输运性质

Salem A, Salwa As, Hussein Sa, Ezzeldien M
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引用次数: 1

摘要

采用一种特殊的改性Bridgman晶体生长技术合成了铜铟镓二碲化(CIGT)单晶。我们的XRD图谱清楚地显示为单相。首次在143 ~ 558 K范围内证明了CuInGaTe2单晶电导率σ(T)和霍尔系数RH(T)的温度依赖性。霍尔系数符号证实样品显示p型导电。研究了电导率、霍尔系数、霍尔迁移率和载流子浓度与温度的关系,并给出了清晰有效的图像。CuInGaTe2单晶显示出0.64 eV至0.85 eV范围内的电带隙(或“输运隙”)。电导率和载流子浓度测定结果表明,样品为p型,受体能级为≈0.027 eV。根据得到的实验数据,估计了所考虑的晶体的主要基本物理常数和其他物理常数。
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Synthesis and Electrical Transport Properties of CuInGaTe2
Copper Indium Gallium di-telluride (CIGT) single crystals were synthesized by a special modified Bridgman technique for crystal growth. Our XRD patterns clearly exhibited single phase. The temperature dependence of the electrical conductivity σ(T), Hall coefficient RH(T) in CuInGaTe2 single crystals have been demonstrated over the temperature range 143-558 K for the first time. The Hall coefficient sign confirms the samples displays the p-type conducting. The temperature dependence of the conductivity, Hall coefficient, Hall mobility, and charge carriers concentration were investigated were presented with a clear and effective pictures. CuInGaTe2 single crystals revealed electrical band gaps (or "transport gaps") ranging from 0.64 eV to 0.85 eV. The results obtained from electrical conductivity and carrier concentration revealed the sample p-type with acceptor energy level equal to ≈ 0.027 eV. From the obtained experimental data, the main fundamental physical constants and others for crystals under consideration have been estimated.
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