{"title":"聚苯胺薄膜的TSC","authors":"M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta","doi":"10.1109/ICSD.1998.709353","DOIUrl":null,"url":null,"abstract":"We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"68 1","pages":"585-588"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"TSC of polyaniline thin film\",\"authors\":\"M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta\",\"doi\":\"10.1109/ICSD.1998.709353\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"68 1\",\"pages\":\"585-588\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709353\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.