C. Lisbôa, F. Kastensmidt, E. H. Neto, G. Wirth, L. Carro
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Using built-in sensors to cope with long duration transient faults in future technologies
Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses bulk built-in current sensors and recomputation is proposed here.
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