{"title":"在多捕获时钟扫描模式中实现偶然的n检测标记","authors":"Gaurav Bhargava, Dale Meehl, J. Sage","doi":"10.1109/TEST.2007.4437648","DOIUrl":null,"url":null,"abstract":"Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"24 1","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns\",\"authors\":\"Gaurav Bhargava, Dale Meehl, J. Sage\",\"doi\":\"10.1109/TEST.2007.4437648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"24 1\",\"pages\":\"1-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2007.4437648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2007.4437648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns
Multi-capture-clock scan patterns for the traditional stuck-at-fault model have been used to reduce down pattern counts while still maintaining high test coverage. This paper studies how the same test patterns provide a decent N-detect fault coverage.
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