{"title":"紧凑型集成开关电容DC-DC变换器优于最坏情况的设计方法","authors":"Dongkwun Kim, Mingoo Seok","doi":"10.1145/3218603.3218610","DOIUrl":null,"url":null,"abstract":"We suggest a new methodology in co-designing an integrated switched-capacitor converter and a digital load. Conventionally, a load has been specified to the minimum supply voltage and the maximum power dissipation, each found at her own worst-case process, workload, and environment condition. Furthermore, in designing an SC DC-DC converter toward this worst-case load specification, designers often have been adding another separate pessimistic assumption on power-switch's resistance and flying-capacitor's density of an SC converter. Such worst-case design methodology can lead to a significantly over-sized flying capacitor and thereby limit on-chip integration of a converter. Our proposed methodology instead adopts the better than worst-case (BTWC) perspective to avoid over-design and thus optimizes the area of an SC converter. Specifically, we propose BTWC load modeling where we specify non-pessimistic sets of supply voltage requirement and load power dissipation across variations. In addition, by considering coupled variations between the SC converter and the load integrated in the same die, our methodology can further reduce the pessimism in power-switch's resistance and capacitor density. The proposed co-design methodology is verified with a 2:1 SC converter and a digital load in a 65 nm. The resulted converter achieves more than one order of magnitude reduction in the flying capacitor size as compared to the conventional worst-case design while maintaining the target conversion efficiency and target throughput. We also verified our methodology with a wide range of load characteristics in terms of their supply voltages and current draw and confirmed the similar benefits.","PeriodicalId":20456,"journal":{"name":"Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Better-Than-Worst-Case Design Methodology for a Compact Integrated Switched-Capacitor DC-DC Converter\",\"authors\":\"Dongkwun Kim, Mingoo Seok\",\"doi\":\"10.1145/3218603.3218610\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We suggest a new methodology in co-designing an integrated switched-capacitor converter and a digital load. Conventionally, a load has been specified to the minimum supply voltage and the maximum power dissipation, each found at her own worst-case process, workload, and environment condition. Furthermore, in designing an SC DC-DC converter toward this worst-case load specification, designers often have been adding another separate pessimistic assumption on power-switch's resistance and flying-capacitor's density of an SC converter. Such worst-case design methodology can lead to a significantly over-sized flying capacitor and thereby limit on-chip integration of a converter. Our proposed methodology instead adopts the better than worst-case (BTWC) perspective to avoid over-design and thus optimizes the area of an SC converter. Specifically, we propose BTWC load modeling where we specify non-pessimistic sets of supply voltage requirement and load power dissipation across variations. In addition, by considering coupled variations between the SC converter and the load integrated in the same die, our methodology can further reduce the pessimism in power-switch's resistance and capacitor density. The proposed co-design methodology is verified with a 2:1 SC converter and a digital load in a 65 nm. The resulted converter achieves more than one order of magnitude reduction in the flying capacitor size as compared to the conventional worst-case design while maintaining the target conversion efficiency and target throughput. We also verified our methodology with a wide range of load characteristics in terms of their supply voltages and current draw and confirmed the similar benefits.\",\"PeriodicalId\":20456,\"journal\":{\"name\":\"Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3218603.3218610\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3218603.3218610","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Better-Than-Worst-Case Design Methodology for a Compact Integrated Switched-Capacitor DC-DC Converter
We suggest a new methodology in co-designing an integrated switched-capacitor converter and a digital load. Conventionally, a load has been specified to the minimum supply voltage and the maximum power dissipation, each found at her own worst-case process, workload, and environment condition. Furthermore, in designing an SC DC-DC converter toward this worst-case load specification, designers often have been adding another separate pessimistic assumption on power-switch's resistance and flying-capacitor's density of an SC converter. Such worst-case design methodology can lead to a significantly over-sized flying capacitor and thereby limit on-chip integration of a converter. Our proposed methodology instead adopts the better than worst-case (BTWC) perspective to avoid over-design and thus optimizes the area of an SC converter. Specifically, we propose BTWC load modeling where we specify non-pessimistic sets of supply voltage requirement and load power dissipation across variations. In addition, by considering coupled variations between the SC converter and the load integrated in the same die, our methodology can further reduce the pessimism in power-switch's resistance and capacitor density. The proposed co-design methodology is verified with a 2:1 SC converter and a digital load in a 65 nm. The resulted converter achieves more than one order of magnitude reduction in the flying capacitor size as compared to the conventional worst-case design while maintaining the target conversion efficiency and target throughput. We also verified our methodology with a wide range of load characteristics in terms of their supply voltages and current draw and confirmed the similar benefits.