高频磁芯损耗数据采集的自动化

IF 1 4区工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS Compel-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Pub Date : 2023-06-25 DOI:10.1109/COMPEL52896.2023.10221076

Jacob R. Anderson, Mike K. Ranjram

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引用次数: 0

摘要

磁芯损耗通常使用幂律拟合来报告，该幂律拟合适用于在单个磁芯形状上收集的有限数量的数据。开发能够输出完整“损失图”的自动化测试器是改进该报告的一种方法。传统的测量技术是自动化的，但只有500 kHz-1MHz。在本文中，我们开发了一个适用于> 1MHz频段的自动铁芯损耗测试仪，并讨论了它的实现和权衡。测试仪产生的数据在制造商报告数据的12.6%-57%之间，遵循类似的磁通密度与功率损耗密度的趋势，但倾向于高估堆芯损耗。讨论了自动化过程中的误差来源以及未来改进系统的策略。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automation of High-Frequency Magnetic Core Loss Data Collection

Core loss is often reported using power-law fits on a limited amount of data collected on a single core shape. The development of automated testers which output a full ‘loss map’ is one approach towards improving this reporting. Conventional measurement techniques are automatable but only to 500 kHz-1MHz. In this paper, we develop an automated core loss tester suitable for the > 1MHz regime and discuss its implementation and trade-offs. The tester produces data that is within 12.6%-57% of manufacturer-reported data, following similar trends for flux-density versus power loss density but tending to overestimate core loss. Sources of error in the automation procedure are discussed as well as strategies for future improvement of the system.

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来源期刊

Compel-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 工程技术-工程：电子与电气

CiteScore

1.60

自引率

0.00%

发文量

124

审稿时长

4.2 months

期刊介绍： COMPEL exists for the discussion and dissemination of computational and analytical methods in electrical and electronic engineering. The main emphasis of papers should be on methods and new techniques, or the application of existing techniques in a novel way. Whilst papers with immediate application to particular engineering problems are welcome, so too are papers that form a basis for further development in the area of study. A double-blind review process ensures the content''s validity and relevance.