Eunsung Lee, Woon-Bae Kim, I. Song, C. Moon, M. Kang, H. Kim, K. Chun
{"title":"一种不受形貌影响的晶圆级铆钉封装,具有类似乐高的组装","authors":"Eunsung Lee, Woon-Bae Kim, I. Song, C. Moon, M. Kang, H. Kim, K. Chun","doi":"10.1109/SENSOR.2005.1497488","DOIUrl":null,"url":null,"abstract":"The authors have successfully demonstrated an alternative method for high yield packaging process, offering a morphological insensitive and wafer level process. It enables not only the encapsulation to be hermetic but also the vias to be electrically-interconnected simultaneously. The mushroom structure of cap wafer makes the seal-line of solder void-free and the assembly process easier in wafer-alignment, giving room for the mismatched-volume between solder and trench. The mushroom structure is formed by SF/sub 6/-based isotropic Si etch and the solder of Sn is electroplated by thick photoresist lithography. The vias are successfully sealed with solders shaped like a dome at the top corner and electrically interconnected. A gross leak detection of pressurized dye-penetration shows that this scheme is morphologically insensitive compared with the \"face-to-face\" bonding method.","PeriodicalId":22359,"journal":{"name":"The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05.","volume":"21 1","pages":"1977-1980 Vol. 2"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A morphology-independent wafer level rivet packaging with Lego-like assembly\",\"authors\":\"Eunsung Lee, Woon-Bae Kim, I. Song, C. Moon, M. Kang, H. Kim, K. Chun\",\"doi\":\"10.1109/SENSOR.2005.1497488\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have successfully demonstrated an alternative method for high yield packaging process, offering a morphological insensitive and wafer level process. It enables not only the encapsulation to be hermetic but also the vias to be electrically-interconnected simultaneously. The mushroom structure of cap wafer makes the seal-line of solder void-free and the assembly process easier in wafer-alignment, giving room for the mismatched-volume between solder and trench. The mushroom structure is formed by SF/sub 6/-based isotropic Si etch and the solder of Sn is electroplated by thick photoresist lithography. The vias are successfully sealed with solders shaped like a dome at the top corner and electrically interconnected. A gross leak detection of pressurized dye-penetration shows that this scheme is morphologically insensitive compared with the \\\"face-to-face\\\" bonding method.\",\"PeriodicalId\":22359,\"journal\":{\"name\":\"The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05.\",\"volume\":\"21 1\",\"pages\":\"1977-1980 Vol. 2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SENSOR.2005.1497488\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SENSOR.2005.1497488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A morphology-independent wafer level rivet packaging with Lego-like assembly
The authors have successfully demonstrated an alternative method for high yield packaging process, offering a morphological insensitive and wafer level process. It enables not only the encapsulation to be hermetic but also the vias to be electrically-interconnected simultaneously. The mushroom structure of cap wafer makes the seal-line of solder void-free and the assembly process easier in wafer-alignment, giving room for the mismatched-volume between solder and trench. The mushroom structure is formed by SF/sub 6/-based isotropic Si etch and the solder of Sn is electroplated by thick photoresist lithography. The vias are successfully sealed with solders shaped like a dome at the top corner and electrically interconnected. A gross leak detection of pressurized dye-penetration shows that this scheme is morphologically insensitive compared with the "face-to-face" bonding method.