用于通道内堵塞检测和流型表征的电粒子速度测定仪

Tae Yoon Kim, Young‐Ho Cho
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引用次数: 0

摘要

我们提出了一种能够检测通道内堵塞和微流体装置中流动颗粒的流动模式的电子粒子速度分析器。我们从粒子通过传感电极产生的电压信号中测量粒子的位置和速度,最终得到粒子在通道流中的速度分布。在实验研究中,测量的粒子速度分布的不确定度为5.44%,相当于之前光学方法的不确定度为5%。我们还通过实验验证了该方法用于通道内堵塞检测的能力。与以往的光学方法相比,电粒子速度测定仪具有结构简单、成本低、可集成于集成生物流体系统等优点。
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An Electrical Particle Velocity Profiler for In-Channel Clogging Detection and Flow Pattern Characterization
We present an electrical particle velocity profiler capable to detect in-channel clogging and flow pattern of the particles flowing in microfluidic devices. We measure both the particle position and velocity from the voltage signals generated by the particles passing across sensing electrodes, from which we finally obtain the velocity profile of the particles in channel flow. In the experimental study, the particle velocity profile is measured with the uncertainty of 5.44%, which is equivalent to the uncertainty of 5% in the previous optical method. We also experimentally verify the capability of the present method for the in-channel clogging detection. Compared to the previous optical methods, the present electrical particle velocity profiler offers the simpler structure, the cheaper cost, and the higher integrability to integrated bio fluidic systems.
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