{"title":"BESSY II上的μmRIXS光谱仪","authors":"A. Pietzsch","doi":"10.17815/JLSRF-2-80","DOIUrl":null,"url":null,"abstract":"The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.","PeriodicalId":16282,"journal":{"name":"Journal of large-scale research facilities JLSRF","volume":"29 1","pages":"55"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The μmRIXS spectrometer at BESSY II\",\"authors\":\"A. Pietzsch\",\"doi\":\"10.17815/JLSRF-2-80\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.\",\"PeriodicalId\":16282,\"journal\":{\"name\":\"Journal of large-scale research facilities JLSRF\",\"volume\":\"29 1\",\"pages\":\"55\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-03-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of large-scale research facilities JLSRF\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17815/JLSRF-2-80\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of large-scale research facilities JLSRF","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17815/JLSRF-2-80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.
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