{"title":"宽带差分干涉仪的输出信号与单模光波导厚度的关系","authors":"K. Gut","doi":"10.1117/12.2536658","DOIUrl":null,"url":null,"abstract":"The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.","PeriodicalId":50449,"journal":{"name":"Fiber and Integrated Optics","volume":null,"pages":null},"PeriodicalIF":2.3000,"publicationDate":"2019-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide\",\"authors\":\"K. Gut\",\"doi\":\"10.1117/12.2536658\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.\",\"PeriodicalId\":50449,\"journal\":{\"name\":\"Fiber and Integrated Optics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2019-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fiber and Integrated Optics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2536658\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fiber and Integrated Optics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1117/12.2536658","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide
The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.
期刊介绍：
Fiber and Integrated Optics , now incorporating the International Journal of Optoelectronics, is an international bimonthly journal that disseminates significant developments and in-depth surveys in the fields of fiber and integrated optics. The journal is unique in bridging the major disciplines relevant to optical fibers and electro-optical devices. This results in a balanced presentation of basic research, systems applications, and economics. For more than a decade, Fiber and Integrated Optics has been a valuable forum for scientists, engineers, manufacturers, and the business community to exchange and discuss techno-economic advances in the field.
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