{"title":"一种优秀的光子辅助测量系统，用于高阶模式近场扫描","authors":"I. Lee, M. Choe, Dong-Joon Lee, E. Choi","doi":"10.1109/IRMMW-THZ.2015.7327658","DOIUrl":null,"url":null,"abstract":"We present experimental results of TE6,2 mode electric field pattern results utilizing a photonic-assisted W-band measurement system and a vector network analyzer (VNA) system in the reactive near field region. We introduce the photonic-assisted W-band measurement system and demonstrate that it provides extremely precise probing capability compared to the VNA system, especially when a higher order mode pattern is scanned in the extreme near field region.","PeriodicalId":6577,"journal":{"name":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","volume":"22 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Excellent photonic-assisted measurement system for high order mode pattern scan in reactive near field\",\"authors\":\"I. Lee, M. Choe, Dong-Joon Lee, E. Choi\",\"doi\":\"10.1109/IRMMW-THZ.2015.7327658\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present experimental results of TE6,2 mode electric field pattern results utilizing a photonic-assisted W-band measurement system and a vector network analyzer (VNA) system in the reactive near field region. We introduce the photonic-assisted W-band measurement system and demonstrate that it provides extremely precise probing capability compared to the VNA system, especially when a higher order mode pattern is scanned in the extreme near field region.\",\"PeriodicalId\":6577,\"journal\":{\"name\":\"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)\",\"volume\":\"22 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2015.7327658\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2015.7327658","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Excellent photonic-assisted measurement system for high order mode pattern scan in reactive near field
We present experimental results of TE6,2 mode electric field pattern results utilizing a photonic-assisted W-band measurement system and a vector network analyzer (VNA) system in the reactive near field region. We introduce the photonic-assisted W-band measurement system and demonstrate that it provides extremely precise probing capability compared to the VNA system, especially when a higher order mode pattern is scanned in the extreme near field region.
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