{"title":"正弦测量中独立定时抖动的检测","authors":"M. Morelande, D. R. Iskander","doi":"10.1109/SSP.2001.955252","DOIUrl":null,"url":null,"abstract":"Two detectors of symmetrically distributed independent timing jitter in a data record composed of a complex harmonic in additive white Gaussian noise are proposed. The proposed detectors are computationally efficient and, although they are formulated using asymptotic results, they may be effectively used with small sample lengths under a wide range of conditions. The performances of the detectors are analysed using simulations and theoretical results.","PeriodicalId":70952,"journal":{"name":"信号处理","volume":"23 1","pages":"182-185"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detection of independent timing jitter in sinusoidal measurements\",\"authors\":\"M. Morelande, D. R. Iskander\",\"doi\":\"10.1109/SSP.2001.955252\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two detectors of symmetrically distributed independent timing jitter in a data record composed of a complex harmonic in additive white Gaussian noise are proposed. The proposed detectors are computationally efficient and, although they are formulated using asymptotic results, they may be effectively used with small sample lengths under a wide range of conditions. The performances of the detectors are analysed using simulations and theoretical results.\",\"PeriodicalId\":70952,\"journal\":{\"name\":\"信号处理\",\"volume\":\"23 1\",\"pages\":\"182-185\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"信号处理\",\"FirstCategoryId\":\"1093\",\"ListUrlMain\":\"https://doi.org/10.1109/SSP.2001.955252\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"信号处理","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.1109/SSP.2001.955252","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection of independent timing jitter in sinusoidal measurements
Two detectors of symmetrically distributed independent timing jitter in a data record composed of a complex harmonic in additive white Gaussian noise are proposed. The proposed detectors are computationally efficient and, although they are formulated using asymptotic results, they may be effectively used with small sample lengths under a wide range of conditions. The performances of the detectors are analysed using simulations and theoretical results.
期刊介绍:
Journal of Signal Processing is an academic journal supervised by China Association for Science and Technology and sponsored by China Institute of Electronics. The journal is an academic journal that reflects the latest research results and technological progress in the field of signal processing and related disciplines. It covers academic papers and review articles on new theories, new ideas, and new technologies in the field of signal processing. The journal aims to provide a platform for academic exchanges for scientific researchers and engineering and technical personnel engaged in basic research and applied research in signal processing, thereby promoting the development of information science and technology. At present, the journal has been included in the three major domestic core journal databases "China Science Citation Database (CSCD), China Science and Technology Core Journals (CSTPCD), Chinese Core Journals Overview" and Coaj. It is also included in many foreign databases such as Scopus, CSA, EBSCO host, INSPEC, JST, etc.