{"title":"星期二的全体会议主题演讲:测试业务:测试和半导体经济学","authors":"W. Rhines","doi":"10.1109/TEST.2016.7805816","DOIUrl":null,"url":null,"abstract":"Test methodology changes have historically been driven largely by necessity-critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"35 1","pages":"9"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Plenary keynote address Tuesday: The business of test: Test and semiconductor economics\",\"authors\":\"W. Rhines\",\"doi\":\"10.1109/TEST.2016.7805816\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test methodology changes have historically been driven largely by necessity-critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"35 1\",\"pages\":\"9\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2016.7805816\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2016.7805816","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Plenary keynote address Tuesday: The business of test: Test and semiconductor economics
Test methodology changes have historically been driven largely by necessity-critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.