{"title":"飞行时间二次离子质谱法","authors":"P. Bertrand, L. Weng","doi":"10.1007/978-3-7091-6555-3_8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18642,"journal":{"name":"Mikrochemie vereinigt mit Mikrochimica acta","volume":"1 1","pages":"167-182"},"PeriodicalIF":0.0000,"publicationDate":"1996-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":"{\"title\":\"Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)\",\"authors\":\"P. Bertrand, L. Weng\",\"doi\":\"10.1007/978-3-7091-6555-3_8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18642,\"journal\":{\"name\":\"Mikrochemie vereinigt mit Mikrochimica acta\",\"volume\":\"1 1\",\"pages\":\"167-182\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"47\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Mikrochemie vereinigt mit Mikrochimica acta\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-7091-6555-3_8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Mikrochemie vereinigt mit Mikrochimica acta","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-7091-6555-3_8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}