大功率脉冲磁控溅射提高ito -金属- ito夹层膜在Poly衬底上的优值

Hui Li, Ying Gao, Shuo-Huang Yuan, D. Wuu, Wan‐Yu Wu, Sam Zhang
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引用次数: 18

摘要

采用高功率脉冲磁控溅射(HiPIMS)技术在室温下在聚萘二甲酸乙二醇酯基底上沉积了ITO/Ag/ITO (IAgI)和ITO/Cu/ITO (ICuI)夹层膜,作为柔性透明导电材料。杂化层由40 nm的ITO底层和40 nm的ITO顶层和5-20 nm的Ag或Cu中间层构成。对不同厚度金属间层薄膜的微观结构和光电性能进行了分析。由于hiims过程中的高功率密度和高电离等离子体,IAgI和ICuI夹层结构具有良好的结晶度和光滑的表面,具有高透光率和低片阻。IAgI薄膜的最优优值为101.16 × 10−3·Ω−1,金属层厚度为10 nm的ICuI薄膜的最优优值为4.83 × 10−3·Ω−1,均高于室温溅射法制备的类似结构。这些结果表明,HiPIMS是一种很有前途的技术,可以将透明导电薄膜沉积在软基板上,用于柔性光电器件。
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Improvement in the Figure of Merit of ITO-Metal-ITO Sandwiched Films on Poly Substrate by High-Power Impulse Magnetron Sputtering
High-power impulse magnetron sputtering (HiPIMS) was used to deposit ITO/Ag/ITO (IAgI) and ITO/Cu/ITO (ICuI) sandwiched films on polyethylene naphthalate substrate at room temperature as flexible transparent conductive materials. The hybrid layers were constructed with 40 nm ITO bottom and top layers, and a 5–20 nm Ag or Cu interlayer. The microstructure and optoelectrical properties were estimated for these films with various thicknesses of the metal interlayer. Thanks to the high-power density and highly ionized plasma in the HiPIMS process, the IAgI and ICuI sandwich structures exhibited good crystallinity and smooth surfaces with high optical transmittance and low sheet resistance. The optimal figure of merit was obtained as 101.16 × 10−3·Ω−1 for the IAgI film and 4.83 × 10−3·Ω−1 for the ICuI film with the metal interlayer thickness of 10 nm, both of which are higher than that from a similar structure reported via sputtering at room temperature. These results indicate that HiPIMS is a promising technique to deposit transparent conductive films onto soft substrates for applications in flexible optoelectronic devices.
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