A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda
{"title":"电子等级绝缘聚合物估计由XPS和UPS","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ICSD.1998.709265","DOIUrl":null,"url":null,"abstract":"In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"59 1","pages":"221-224"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Electronic levels insulating polymers estimated by XPS and UPS\",\"authors\":\"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda\",\"doi\":\"10.1109/ICSD.1998.709265\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"59 1\",\"pages\":\"221-224\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709265\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709265","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electronic levels insulating polymers estimated by XPS and UPS
In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.