超高密度纵向磁记录用CoCrPt(Ta,B)/Cr磁性薄膜介质结构设计

Pawel Glijer, Kyusik Sin, John M. Sivertsen, Jack H. Judy
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引用次数: 2

摘要

研究了具有Cr衬底的CoCrPt(Ta,B)薄膜作为超高密度磁记录介质用于10 Gbits/inch2数据存储的潜在候选材料。所采用的实验方法旨在分析这些薄膜的结构-性能关系。因此,结构和成分的变化导致磁性和噪声特性已被确定。结果表明,Pt含量为<的CoCrPt薄膜的面内矫顽力可达到2700 Oe以上;20。%;CoCrPtTa中Pt含量<Pt含量为12% Pt(含2.5-5% Ta)和CoCrPtB(含3-7% B);11%。此外,改进S *、噪声特性和细化晶粒尺寸和表面粗糙度的方法也已被证明。
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Structural design of CoCrPt(Ta,B)/Cr magnetic thin film media for ultra high density longitudinal magnetic recording

CoCrPt(Ta,B) thin films with Cr underlayers were studied as potential candidates for ultra-high density magnetic recording media for data storage at 10 Gbits/inch2. The experimental approach used was aimed at an analysis of the structure-properties relationships in these thin films. As a result structural and composition changes resulting in magnetic and noise properties have been identified. It has been shown that very high in-plane coercivities of 2700 Oe and above could be obtained in CoCrPt films with Pt contents < 20 at.%; in CoCrPtTa for Pt contents < 12% Pt (with 2.5–5% Ta) and in CoCrPtB (with 3–7% B) for Pt contents < 11%. Also methods for improvement of S, noise characteristics and refinement of grain size and surface roughness have been demonstrated.

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