M. Dabban, Esam M. G. Al-Badwi, Sarah M. Al-Khadher
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引用次数: 0
摘要
硫系玻璃(ChGs)半导体具有许多有用的特性,特别是在技术应用方面。本研究解释了GexBi5S95-x (x = 0、10、20、30、35和45 at)许多物理性质的组分依赖性。%)。随着Ge含量的增加,合金的软盘模式、孤对电子、化学偏差和原子化热的比例降低,而平均配位数< r >、约束、密度和摩尔体积增加,表明合金从软盘模式向刚性模式转变。基于键序网络模型(CONM),通过分析键能及其分布,估计了平均总键能、电负性差、带隙能和玻璃化转变温度。结果表明,当Ge≤30 at时,这些参数均增大。%,并随着Ge含量的进一步增加而降低。这种行为可以用Tanaka提出的网络化学渗透阈值来解释。这个阈值表示从r小于2.67的二维结构到r≥2.67的三维结构的拓扑相变。将Ge掺入玻璃化的Bi-S体系中,产生了有趣的物理特性,如阈值和相变,证实了这种组合物适合于光存储介质。
THEORETICALLY PREDICTED DEVIATION IN PHYSICAL PROPERTIES OF GE-BI-S CHALCOGENIDE ALLOYS WITH COMPOSITIONAL VARIATIONS
Chalcogenide glasses (ChGs) semiconductors have several useful properties, especially in their technical applications. The present work explains the compositional dependence of many physical properties of GexBi5S95-x (x = 0, 10, 20, 30, 35 and 45 at. %). Increasing Ge content reduces the fraction of floppy modes, the lone pair electrons, the stoichiometric deviation, and the heat of atomization, while the average coordination number 〈r〉, constraints, density, and molar volume increased, indicating the alloys have moved from floppy to rigid mode. The average overall bond energy, electronegativity difference, band gap energy, and glass transition temperature were estimated by analyzing the bond energies and its distribution based on the bond ordered network model (CONM). It has been found that all these parameters increase with Ge ≤ 30 at. % and decrease with the further increase of Ge content. This behavior can be explained in terms of the network chemical percolation threshold proposed by Tanaka. This threshold represents a topological phase transition from a two-dimensional structure at r˂2.67 to a three-dimensional structure at r≥2.67. The incorporation of Ge into the glassy Bi-S system yields interesting physical properties such as threshold and phase transition, confirming this composition's suitability for optical storage media.