{"title":"电子显微镜表面状态成像:半经典模型","authors":"J. Bolton, L. M. Brown","doi":"10.1098/rspa.1990.0036","DOIUrl":null,"url":null,"abstract":"A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.","PeriodicalId":20605,"journal":{"name":"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1990-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Imaging surface states in the electron microscope: a semiclassical model\",\"authors\":\"J. Bolton, L. M. Brown\",\"doi\":\"10.1098/rspa.1990.0036\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.\",\"PeriodicalId\":20605,\"journal\":{\"name\":\"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-04-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1098/rspa.1990.0036\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1098/rspa.1990.0036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Imaging surface states in the electron microscope: a semiclassical model
A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.