电子显微镜表面状态成像:半经典模型

J. Bolton, L. M. Brown
{"title":"电子显微镜表面状态成像:半经典模型","authors":"J. Bolton, L. M. Brown","doi":"10.1098/rspa.1990.0036","DOIUrl":null,"url":null,"abstract":"A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.","PeriodicalId":20605,"journal":{"name":"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences","volume":"5 1","pages":"291 - 305"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Imaging surface states in the electron microscope: a semiclassical model\",\"authors\":\"J. Bolton, L. M. Brown\",\"doi\":\"10.1098/rspa.1990.0036\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.\",\"PeriodicalId\":20605,\"journal\":{\"name\":\"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences\",\"volume\":\"5 1\",\"pages\":\"291 - 305\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-04-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1098/rspa.1990.0036\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1098/rspa.1990.0036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

一束电子,掠过半导体或绝缘体的表面,可以引起局域表面状态带之间的跃迁。当散射光束在能量分辨透射电子显微镜中聚焦时,获得表面图像。本文采用半经典模型分析了非弹性电子表面散射,并预测了表面图像的亮度和形状。半经典模型的有效范围取决于初始和最终表面波函数在垂直于表面方向上的对称性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Imaging surface states in the electron microscope: a semiclassical model
A beam of electrons, grazing the surface of a semiconductor or insulator, can cause transitions between bands of localized surface states. When the scattered beam is focused in an energy-resolving transmission electron microscope, an image of the surface is obtained. This paper uses a semiclassical model to analyse inelastic electron-surface scattering and predict the brightness and shape of the surface image. The range of validity of the semiclassical model depends on the symmetries of the initial and final surface wavefunctions in a direction perpendicular to the surface.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Some examples of Penrose’s quasi-local mass construction The influence of diffusion on the current-voltage curve in a flame ionization detector High strain-rate shear response of polycarbonate and polymethyl methacrylate On the evolution of plane detonations On the solutions of a class of dual integral equations occurring in diffraction problems
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1