T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka
{"title":"二维双折射矢量分布自动测量系统","authors":"T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka","doi":"10.1109/ICSD.1998.709346","DOIUrl":null,"url":null,"abstract":"We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"55 1","pages":"557-560"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"An automatic measurement system for 2-dimensional birefringence vector distribution\",\"authors\":\"T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka\",\"doi\":\"10.1109/ICSD.1998.709346\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"55 1\",\"pages\":\"557-560\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709346\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709346","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An automatic measurement system for 2-dimensional birefringence vector distribution
We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.