提高汽车R-F PCB热循环测试性能的研究

Chen-xi Xie, Jie-Guo, Mei-Juan Kuang
{"title":"提高汽车R-F PCB热循环测试性能的研究","authors":"Chen-xi Xie, Jie-Guo, Mei-Juan Kuang","doi":"10.1109/impact56280.2022.9966639","DOIUrl":null,"url":null,"abstract":"With the invention and development of PCB and FPC, Rigidflexible (referred as R-F in the following text) board was designed and realized naturally by engineers. We combine flex and rigid materials by laminating with certain stack-up, these materials contain FCCL, CVL, LF PP, CCL and so on. Due to the great difference of CTE (coefficient of thermal expansion) between these materials, the defect of hole copper crack happens frequently during thermal cycle test (as known as TCT) for R-F board. Normally rigid PCB can survive after more than 1000 cycles of TCT test with condition of - 40°/30min to 125°/30min, however the R-F board will fail within 600 ~ 700 cycles. After a change of resistance more than 10% detected, engineers will find out the crack of copper mainly in the contact surface of LF PP and PI layer of FCCL, which is resulted from the obvious difference between CTE of LF PP and PI. This paper mainly starts from three factors, different kinds of PP with different CTE, through hole copper thickness and copper elongation, to research how these factors affect the life of R-F board enduring TCT with DOE method. Through this paper, we hope to give some suggestions to engineers who wants to enhance the cycles of TCT test of R-F board in PCB industry.","PeriodicalId":13517,"journal":{"name":"Impact","volume":"61 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Research on the Thermal Cycle Test Performance Improving in Automotive R-F PCB\",\"authors\":\"Chen-xi Xie, Jie-Guo, Mei-Juan Kuang\",\"doi\":\"10.1109/impact56280.2022.9966639\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the invention and development of PCB and FPC, Rigidflexible (referred as R-F in the following text) board was designed and realized naturally by engineers. We combine flex and rigid materials by laminating with certain stack-up, these materials contain FCCL, CVL, LF PP, CCL and so on. Due to the great difference of CTE (coefficient of thermal expansion) between these materials, the defect of hole copper crack happens frequently during thermal cycle test (as known as TCT) for R-F board. Normally rigid PCB can survive after more than 1000 cycles of TCT test with condition of - 40°/30min to 125°/30min, however the R-F board will fail within 600 ~ 700 cycles. After a change of resistance more than 10% detected, engineers will find out the crack of copper mainly in the contact surface of LF PP and PI layer of FCCL, which is resulted from the obvious difference between CTE of LF PP and PI. This paper mainly starts from three factors, different kinds of PP with different CTE, through hole copper thickness and copper elongation, to research how these factors affect the life of R-F board enduring TCT with DOE method. Through this paper, we hope to give some suggestions to engineers who wants to enhance the cycles of TCT test of R-F board in PCB industry.\",\"PeriodicalId\":13517,\"journal\":{\"name\":\"Impact\",\"volume\":\"61 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Impact\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/impact56280.2022.9966639\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Impact","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/impact56280.2022.9966639","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

随着PCB和FPC的发明和发展,Rigidflexible(下文简称R-F)板自然被工程师们设计和实现。我们通过一定的层叠将柔性和刚性材料组合在一起,这些材料包括FCCL, CVL, LF PP, CCL等。由于两种材料的热膨胀系数(CTE)差异较大,R-F板在热循环试验(TCT)中经常出现孔铜裂纹缺陷。通常,刚性PCB在- 40°/30min至125°/30min的条件下进行1000多次TCT测试后可以存活,但R-F板在600 ~ 700次循环内就会失效。在检测到电阻变化超过10%后,工程师会发现铜的裂纹主要出现在FCCL的LF PP和PI层的接触面,这是由于LF PP的CTE和PI的CTE存在明显差异造成的。本文主要从不同CTE的不同PP、通孔铜厚度和铜伸长率三个因素入手,用DOE法研究了这些因素对耐久TCT的R-F板寿命的影响。通过本文的研究,我们希望对PCB行业中希望提高R-F板TCT测试周期的工程师们提供一些建议。
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Research on the Thermal Cycle Test Performance Improving in Automotive R-F PCB
With the invention and development of PCB and FPC, Rigidflexible (referred as R-F in the following text) board was designed and realized naturally by engineers. We combine flex and rigid materials by laminating with certain stack-up, these materials contain FCCL, CVL, LF PP, CCL and so on. Due to the great difference of CTE (coefficient of thermal expansion) between these materials, the defect of hole copper crack happens frequently during thermal cycle test (as known as TCT) for R-F board. Normally rigid PCB can survive after more than 1000 cycles of TCT test with condition of - 40°/30min to 125°/30min, however the R-F board will fail within 600 ~ 700 cycles. After a change of resistance more than 10% detected, engineers will find out the crack of copper mainly in the contact surface of LF PP and PI layer of FCCL, which is resulted from the obvious difference between CTE of LF PP and PI. This paper mainly starts from three factors, different kinds of PP with different CTE, through hole copper thickness and copper elongation, to research how these factors affect the life of R-F board enduring TCT with DOE method. Through this paper, we hope to give some suggestions to engineers who wants to enhance the cycles of TCT test of R-F board in PCB industry.
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