J. Brenkus, V. Stopjaková, Ronny Vanhooren, A. Chichkov
{"title":"混合信号电路中不同测试策略的比较","authors":"J. Brenkus, V. Stopjaková, Ronny Vanhooren, A. Chichkov","doi":"10.1109/DDECS.2009.5012090","DOIUrl":null,"url":null,"abstract":"An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"1 1","pages":"16-19"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparison of different test strategies on a mixed-signal circuit\",\"authors\":\"J. Brenkus, V. Stopjaková, Ronny Vanhooren, A. Chichkov\",\"doi\":\"10.1109/DDECS.2009.5012090\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":\"1 1\",\"pages\":\"16-19\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012090\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparison of different test strategies on a mixed-signal circuit
An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.
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