160Tb衰变中的β粒子和γ射线发射概率

K. Singh, Kawaldeep, Vijay Kumar, Neena, Rupinder Kaur
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引用次数: 2

摘要

用两个半导体探测器精确测量了160Tb衰变中的相对γ射线强度。这些强度被用来计算粒子和γ射线发射概率及其相应的不确定性,方法是利用标准数学误差传播技术推导出方程(Browne, 1986, 1988)。
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Beta-particle and gamma-ray emission probabilities in the decay of 160Tb

Relative γ-ray intensities in the decay of 160Tb were precisely measured using two semiconductor detectors. These intensities were used to calculate particle and γ-ray emission probabilities along with their corresponding uncertainties by employing equations derived with standard mathematical error propagating technique (Browne, 1986, 1988).

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