Fan Jiaxun, Jun Bai, Zhiyao Liu, Yilu Chen, Chen-Yin Wu, Wang Zibo, Bailing Wang
{"title":"工业控制装置的主动和被动联合识别方法","authors":"Fan Jiaxun, Jun Bai, Zhiyao Liu, Yilu Chen, Chen-Yin Wu, Wang Zibo, Bailing Wang","doi":"10.12783/DTCSE/CCNT2020/35411","DOIUrl":null,"url":null,"abstract":"Obtaining a complete device inventory is important for securing industrial control systems. For that reason, we developed an industrial control device identification method based on the combination of active and passive approaches. The main tasks of identification method consist of device level identification and specific device information acquisition. Device level identification algorithm, particularly with IPlayer data pre-processing, helps to obtain device types in a passive way, distinguishing between PLCs and non-PLC devices in a short time. After that, we use the active method to further obtain the details of different types of devices. Experimental results verify the effectiveness of this method.","PeriodicalId":11066,"journal":{"name":"DEStech Transactions on Computer Science and Engineering","volume":"112 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Active and Passive Combined Identification Approaches for Industrial Control Devices\",\"authors\":\"Fan Jiaxun, Jun Bai, Zhiyao Liu, Yilu Chen, Chen-Yin Wu, Wang Zibo, Bailing Wang\",\"doi\":\"10.12783/DTCSE/CCNT2020/35411\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Obtaining a complete device inventory is important for securing industrial control systems. For that reason, we developed an industrial control device identification method based on the combination of active and passive approaches. The main tasks of identification method consist of device level identification and specific device information acquisition. Device level identification algorithm, particularly with IPlayer data pre-processing, helps to obtain device types in a passive way, distinguishing between PLCs and non-PLC devices in a short time. After that, we use the active method to further obtain the details of different types of devices. Experimental results verify the effectiveness of this method.\",\"PeriodicalId\":11066,\"journal\":{\"name\":\"DEStech Transactions on Computer Science and Engineering\",\"volume\":\"112 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-03-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DEStech Transactions on Computer Science and Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.12783/DTCSE/CCNT2020/35411\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DEStech Transactions on Computer Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12783/DTCSE/CCNT2020/35411","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Active and Passive Combined Identification Approaches for Industrial Control Devices
Obtaining a complete device inventory is important for securing industrial control systems. For that reason, we developed an industrial control device identification method based on the combination of active and passive approaches. The main tasks of identification method consist of device level identification and specific device information acquisition. Device level identification algorithm, particularly with IPlayer data pre-processing, helps to obtain device types in a passive way, distinguishing between PLCs and non-PLC devices in a short time. After that, we use the active method to further obtain the details of different types of devices. Experimental results verify the effectiveness of this method.