基于激活电路的室性心动过速消融对室性心律失常负担的长期影响

F. Freire Barbas De Albuquerque, G. Portugal, P. Silva Cunha, B. Valente, A. Lousinha, A. Delgado, M. Paulo, T. Rosa, M. Brás, R. Cruz Ferreira, M. Oliveira
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引用次数: 0

摘要

资金来源类型:无。室性心律失常(VA)是心力衰竭患者发病和死亡的主要原因。室性心动过速(VT)消融是减少复发性植入式心律转复除颤器(ICD)治疗的既定治疗方法。对于基底相关室速患者,在可行的情况下,对整个心动过速电路进行测绘,可以更准确地定位临床室速。基于基底相关室速的激活测绘,评估导管消融对室速负担的长期影响。纳入2013年1月至2021年10月期间连续接受VT消融的患者。对临床记录和设备监测进行全面审查,以评估室性心律失常负担,定义为所有ICD治疗和临床记录的室性心律失常,消融前后。主要结果是消融术后室性心律失常的总体负担减轻。采用固定效应泊松回归评估消融对VA负荷的影响;采用配对样本Wilcoxon符号秩检验(STATA 12, JASP),在固定时间间隔内进行比较。在研究期间共进行了134例VT消融手术。其中,有21例手术完成了室速激活电路的完整映射,对应于18例患者。平均年龄56.7岁,男性88%,平均左室射血分数39±13%,BNP 540±627 pg/mL。病因为缺血性44%,非缺血性扩张性心肌病39%,心律失常性右室发育不良11%,肥厚性心肌病6%。3例患者采用原位机械支持(2例采用临时VA ECMO, 1例采用LVAD作为目的治疗);除了一名患者外,所有患者都有ICD。手术时间209±61分钟。1例患者出现完全性房室传导阻滞;未见其他围手术期并发症。随访期间2例患者死于心力衰竭,1例患者死于难治性心源性休克伴难治性不间断室速,1例患者行原位心脏移植。消融后平均随访时间为2.2±1.9年。在消融后3个月(减少92.5%,p=0.002)和6个月(减少83.3%,p=0.041)观察到VA负担显著减少(图1)。固定效应泊松回归后,估计VT回路消融后VA负担长期减少75% (CI 12-93%, p=0.031)。靶向电路消融在部分室性心动过速消融患者中是可行的,并导致室性心动过速负担和器械治疗的显著持续减少。
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Long-term impact of activation circuit-based ventricular tachycardia ablation on ventricular arrhythmia burden
Type of funding sources: None. Ventricular arrhythmias (VA) are a major cause of morbidity and mortality in heart failure patients. Ventricular tachycardia (VT) ablation is an established treatment for the reduction of recurrent implantable cardioverter-defibrillator (ICD) therapies in this population. In patients with substrate-related VT, mapping of the entire tachycardia circuit, when feasible, may allow for more accurate targeting of the clinical VT. To assess the long-term impact of catheter ablation based on activation mapping of substrate-related VT on VA burden. Consecutive patients submitted to VT ablation between January 2013 and October 2021 were included. A comprehensive review of clinical records and device monitoring was performed to assess VA burden, defined as all ICD therapies and clinically documented VTs, before and after ablation. The primary outcome was reduction in the overall burden of VA after ablation. The impact of ablation on VA burden was assessed by fixed-effects Poisson regression; comparison at fixed time intervals was performed with a paired-sample Wilcoxon signed-rank test (STATA 12, JASP). A total of 134 VT ablation procedures were performed during the study period. Of these, there were 21 procedures where complete mapping of the VT activation circuit was achieved, corresponding to 18 patients. Mean age was 56.7 years, 88% male sex, mean left ventricular ejection fraction 39 ± 13%, BNP 540 ± 627 pg/mL. Etiology was ischemic in 44%, non-ischemic dilated cardiomyopathy in 39%, arrhythmogenic right ventricular dysplasia in 11% and hypertrophic cardiomyopathy in 6%. Mechanical support was in situ in 3 patients (two with temporary VA ECMO and one with LVAD as destination therapy); all but one patient had an ICD. Procedural duration was 209 ± 61 minutes. One patient developed complete AV block; no other peri-procedural complications were observed. During follow-up two patients died due to heart failure, one patient died from refractory cardiogenic shock with refractory incessant VT and one patient underwent orthotopic heart transplant. The mean follow-up time after ablation was 2.2 ± 1.9 years. A significant reduction in VA burden was observed (Figure 1) at 3 months (92.5% reduction, p=0.002) and 6 months after ablation (83.3% reduction, p=0.041). After fixed-effects Poisson regression, there was an estimated long-term reduction of 75% (CI 12-93%, p=0.031) of VA burden after VT circuit ablation. Targeted circuit ablation is feasible in a subset of patients referred to VT ablation and leads to a significant sustained decrease in VA burden and device therapies.
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