回收低品位铜阳极电精炼中阳极的钝化行为

Koudai Tokushige, K. Mori, S. Oue, H. Matsushima, Kazunari Suzuki, Hiroaki Nakano
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引用次数: 2

摘要

以纯度为78.7质量%的低品位铜阳极为阳极,阳极电流密度为200 a·m -2,以含镍离子0.596 mol·dm -3的未搅拌硫酸盐溶液为杂质,在60℃下进行铜电解,分析了钝化前后阳极泥的结构。电解前,高浓度的Sb、Pb和Ag分散在铜阳极中。低品位铜阳极的钝化时间较短,为17.7 h,含Ni 2+杂质溶液的钝化时间较短,为11.4 h。铜阳极正常溶解时,铜母相以枝晶形式溶解,阳极泥骨架由残余Cu-Ni-Sb-Sn-As化合物组成。在此框架周围观察到Cu 2s和Ag、Pb的单相。钝化后,Cu、Ni、Sn从Cu-Ni-Sb-Sn- as化合物组成的泥骨架中溶解,形成Sb缩合相。这些Cu- ni -Sb- sn - as化合物、Sb凝聚相、黏液骨架周围的cu2s化合物、整个黏液中点缀的Ag和针状PbO抑制了cu2 +离子的扩散,导致黏液与铜基体界面处形成cuso4。在不含Ni 2+的溶液中,钝化发生在黏液厚度约500 μ m处,而在含Ni 2+的溶液中,钝化发生在黏液厚度约300 μ m处。这表明钝化并不仅仅取决于黏液的厚度。在无Ni 2+溶液中钝化形成的cuso4的厚度与含Ni 2+溶液中钝化形成的cuso4的厚度几乎相同。在含Ni 2+离子的溶液中,钝化发生在泥层厚度较小的地方,说明cuso4的溶解度降低,Cu 2+离子的扩散系数降低,容易在铜基体附近形成cuso4。
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Passivation Behaviour of Anode in Copper Electrorefining Using Recycled Low-grade Copper Anode
Cu electrolysis was performed using low-grade copper anode with purity 78.7 mass% at a anode current density of 200 A ・ m -2 in an unagitated sulfate solution containing 0.596 mol ・ dm -3 of Ni 2+ ions as impurity at 60 ℃ , and the structure of anode slime before and after passivation was analyzed. The highly-concentrated Sb, Pb and Ag were dispersed in copper anode before electrolysis. The passivation occurred at short time of 17.7 hours in the case of low-grade copper anode, and it occurred at shorter time of 11.4 hours in the solution containing Ni 2+ ions as impurity. At normal dissolution of copper anode, copper parent phase dissolved in the form of dendrite and the framework of anode slime was composed of remained Cu-Ni-Sb-Sn-As compound. Cu 2 S and single phase of Ag and Pb were observed around this framework. At passivation, Cu, Ni and Sn dissolved from the slime framework composed of Cu-Ni-Sb-Sn-As compound, resulting in formation of Sb condensed phase. These Cu-Ni-Sb-Sn-As compound, Sb condensed phase, Cu 2 S compound around the slime framework, Ag and needle-shaped PbO dotted in the whole slime suppressed the diffusion of Cu 2+ ions, as a result, CuSO 4 was formed at interface between the slime and copper substrate. The passivation occurred at slime thickness of approximately 500 μ m in Ni 2+ -free solution, while it occurred at slime thickness of approximately 300 μ m in solution containing Ni 2+ ions. This indicates that the passivation do not depend on only the thickness of slime. The thickness of CuSO 4 formed at passivation in Ni 2+ -free solution was almost identical with that from the solution containing Ni 2+ ions. In solution containing Ni 2+ ions, the passivation occurred at less thickness of slime, showing that CuSO 4 is easy to be formed in the vicinity of copper substrate due to decrease in solubility of CuSO 4 and diffusion coefficient of Cu 2+ ions.
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