利用堆叠技术调谐PtS2单层材料的电子学和光学性质

Priyanka Priyanka, Ramesh Kumar, F. Chand
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摘要

本研究利用密度泛函理论计算研究了层厚和堆叠工程对单层PtS2电子、结构和光学性质的影响。发现单层PtS2 (m‐PtS2)具有1.73 eV的间接带隙,而双层PtS2 (b‐PtS2)具有0.67 eV的间接带隙。通过六种不同的堆叠方式探讨了堆叠工程对电子和光学性能的影响,发现AA1结构最稳定,反射率和折射率值最高。此外,PtS2双层结构在2-12 eV的宽范围内具有良好的光吸收能力,并且随着层数的增加,吸收边缘的位置呈现红移。这些计算得到的单层PtS2的电子和光学特性验证了它作为未来光电器件的一种有前景的材料。
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Tuning of Electronic and Optical Properties of PtS2 Monolayer Using Stacking Engineering
The present study investigates the influence of layer thickness and stacking engineering on the electronic, structural, and optical properties of monolayer PtS2 using the density functional theory calculations. The monolayer PtS2 (m‐PtS2) is found to possess an indirect bandgap, 1.73 eV, which reduces to 0.67 eV for bilayer PtS2 (b‐PtS2). Impact of stacking engineering on the electronic and optical properties is explored through six different stacking patterns and the AA1 configuration is found to be most stable displaying the highest reflectance and refractive index values. Moreover, this PtS2 bilayer structure demonstrates promising light absorption capability over a wide range (2–12 eV) with the position of absorption edge showing a redshift as the layers number increases. These computed electronic and optical properties of monolayer PtS2 validate it as a prospective material for future optoelectronic devices.
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