{"title":"致编辑的信:关于光反射技术在表面检测分析物浓度的分辨率限制","authors":"A. García-Valenzuela, J. Saniger","doi":"10.1088/0963-9659/7/6/003","DOIUrl":null,"url":null,"abstract":"We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.","PeriodicalId":20787,"journal":{"name":"Pure and Applied Optics: Journal of The European Optical Society Part A","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1998-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"LETTER TO THE EDITOR: On the limit to the resolution of photoreflectance techniques for sensing analyte concentration at surfaces\",\"authors\":\"A. García-Valenzuela, J. Saniger\",\"doi\":\"10.1088/0963-9659/7/6/003\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.\",\"PeriodicalId\":20787,\"journal\":{\"name\":\"Pure and Applied Optics: Journal of The European Optical Society Part A\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Pure and Applied Optics: Journal of The European Optical Society Part A\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0963-9659/7/6/003\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pure and Applied Optics: Journal of The European Optical Society Part A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0963-9659/7/6/003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LETTER TO THE EDITOR: On the limit to the resolution of photoreflectance techniques for sensing analyte concentration at surfaces
We discuss the possibility of approaching a shot-noise-limited measurement of the difference reflectance due to analyte absorption or adsorption on the surface of a thin film, and estimate the resolution for a variety of cases. When using a 1 mW optical beam, the limit of resolution will commonly correspond to a small or very small fraction of a monolayer of the analyte.
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