Simulation-based signal selection for state restoration in silicon debug

Post-silicon validation has become a crucial part of modern integrated circuit design to capture and eliminate functional bugs that escape pre-silicon verification. The most critical roadblock in post-silicon validation is the limited observability of internal signals of a design, since this aspect hinders the ability to diagnose detected bugs. A solution to address this issue leverage trace buffers: these are register buffers embedded into the design with the goal of recording the value of a small number of state elements, over a time interval, triggered by a user-specified event. Due to the trace buffer's area overhead, only a very small fraction of signals can be traced. Thus, the selection of which signals to trace is of paramount importance in post-silicon debugging and diagnosis. Ideally, we would like to select signals enabling the maximum amount of reconstruction of internal signal values. Several signal selection algorithms for post-silicon debug have been proposed in the literature: they rely on a probability-based state-restoration capacity metric coupled with a greedy algorithm. In this work we propose a more accurate restoration capacity metric, based on simulation information, and present a novel algorithm that overcomes some key shortcomings of previous solutions. We show that our technique provides up to 34% better state restoration compared to all previous techniques while showing a much better trend with increasing trace buffer size.