基于显微镜的纳米物理实验室的研究工作

Sang-Gyeong An
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摘要

Sangmin An助理教授是韩国全北国立大学基于显微镜的纳米物理实验室(MNPL)的负责人。他和他的团队正在使用基于原子力显微镜(AFM)的技术作为他们工作的基础,在原子和分子水平上取得材料科学的进步。研究人员正在将他们基于原子力显微镜的技术与扫描隧道显微镜(STM)、拉曼光谱系统和扫描电子显微镜(SEM)相结合。使用各种技术使团队能够推动其领域的进步,并协助半导体技术的进步,包括改进直接影响消费电子产品的表面粗糙度测量技术。An和他的团队还专注于纳米级3D打印,以期克服3D打印分辨率的限制。研究人员利用机械拉杆,通过激光照射穿孔玻璃或石英,制造出纳米吸管。然后将纳米吸管连接到晶体振荡器上,以实现纳米级的3D打印。该团队开发了一种方法,可以使用AFM +原位拉曼光谱直接测量材料的物理性质。通过将afm纳米级3D打印技术与光学仪器相结合,可以测量目标材料的物理、电学、化学和光学性质。An和他的团队也在进行与开尔文探针力显微镜(KPFM)和摩擦测量相关的研究,以及改进AFM和石英音叉AFM (QTF-AFM)系统的AFM技术。
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Research work in the Microscope-based Nanoscale Physics Lab
Assistant Professor Sangmin An is head of the Microscope-based Nanoscale Physics Laboratory (MNPL), Jeonbuk National University, South Korea. He and his team are using atomic force microscope (AFM)-based technology as the basis of their work to make advances in materials science on the atomic and molecular levels. The researchers are combining their AFM-based technology with the scanning tunnelling microscope (STM), Raman spectroscopy systems and scanning electron microscope (SEM). Using this variety of techniques is enabling the team to drive progress in their field and also assisting with advances in semiconductor technology, including improving surface roughness measurement technology, which directly impacts consumer electronics. An and the team are also focused on nanoscale 3D printing with a view to overcoming limitations associated with the resolution of 3D printing. The researchers have fabricated nanopipettes through laser irradiation of perforated glass or quartz using a mechanical puller. The nanopipettes are then attached to a crystal oscillator to enable 3D printing at the nanoscale. The team has developed a process in which physical properties of materials can be measured directly using AFM + in situ Raman spectroscopy. By combining AFM-based nanoscale 3D printing technology and optical apparatus, it is possible to measure the physical, electrical, chemical, and optical properties of target materials. An and the team are also performing investigations related to Kelvin probe force microscope (KPFM) and friction measurement, as well as improving AFM technology for AFM and quartz tuning fork AFM (QTF-AFM) systems.
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