{"title":"双极微电路学习实验方法","authors":"S. Tyulevin, M. Piganov, E. Erantseva","doi":"10.1109/icpcsi.2017.8391836","DOIUrl":null,"url":null,"abstract":"The analysis of methods of the learning experiment of semiconductor microcircuits for individual forecasting of indicators of their quality has been carried out. The choice of informative parameters and means of their control has been made. The schemes of the inclusion of microcircuits in the process of research tests and the modes of their control has been justified. The analysis of constructive-technological variants of microcircuits has been carried out. A program of research tests has been developed. The results of the training experiment for microchips of the 522 series has been presented. The analysis of the experimental data has been carried out. The results of the training experiment for constructing mathematical predictive models of the quality of microcircuits has been recommended to use.","PeriodicalId":6589,"journal":{"name":"2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI)","volume":"10 1","pages":"75-79"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Methods of the learning experiment of bipolar microcircuits\",\"authors\":\"S. Tyulevin, M. Piganov, E. Erantseva\",\"doi\":\"10.1109/icpcsi.2017.8391836\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The analysis of methods of the learning experiment of semiconductor microcircuits for individual forecasting of indicators of their quality has been carried out. The choice of informative parameters and means of their control has been made. The schemes of the inclusion of microcircuits in the process of research tests and the modes of their control has been justified. The analysis of constructive-technological variants of microcircuits has been carried out. A program of research tests has been developed. The results of the training experiment for microchips of the 522 series has been presented. The analysis of the experimental data has been carried out. The results of the training experiment for constructing mathematical predictive models of the quality of microcircuits has been recommended to use.\",\"PeriodicalId\":6589,\"journal\":{\"name\":\"2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI)\",\"volume\":\"10 1\",\"pages\":\"75-79\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/icpcsi.2017.8391836\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering (ICPCSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icpcsi.2017.8391836","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Methods of the learning experiment of bipolar microcircuits
The analysis of methods of the learning experiment of semiconductor microcircuits for individual forecasting of indicators of their quality has been carried out. The choice of informative parameters and means of their control has been made. The schemes of the inclusion of microcircuits in the process of research tests and the modes of their control has been justified. The analysis of constructive-technological variants of microcircuits has been carried out. A program of research tests has been developed. The results of the training experiment for microchips of the 522 series has been presented. The analysis of the experimental data has been carried out. The results of the training experiment for constructing mathematical predictive models of the quality of microcircuits has been recommended to use.
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