{"title":"自定时处理器电源噪声容限测量","authors":"K. Asada, Takuzo Sogabe, T. Nakura, M. Ikeda","doi":"10.1109/DDECS.2009.5012112","DOIUrl":null,"url":null,"abstract":"We have compared the power supply noise tolerance of a synchronous processor and a self-timed processor fabricated using 0.18µm CMOS. We have designed the self-timed processor using the same RTL as the synchronous processor, and translated it into a netlist with DCVSL circuits and completion logic trees. We have demonstrated the synchronous processor shows an error rate of 9.3% for the worst power supply noise in case of 10% timing margin design. On the other hand, the self-timed processor shows 40% speed degradation, but no error, for the same power supply noise.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"15 1","pages":"128-131"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Measurement of power supply noise tolerance of self-timed processor\",\"authors\":\"K. Asada, Takuzo Sogabe, T. Nakura, M. Ikeda\",\"doi\":\"10.1109/DDECS.2009.5012112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have compared the power supply noise tolerance of a synchronous processor and a self-timed processor fabricated using 0.18µm CMOS. We have designed the self-timed processor using the same RTL as the synchronous processor, and translated it into a netlist with DCVSL circuits and completion logic trees. We have demonstrated the synchronous processor shows an error rate of 9.3% for the worst power supply noise in case of 10% timing margin design. On the other hand, the self-timed processor shows 40% speed degradation, but no error, for the same power supply noise.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":\"15 1\",\"pages\":\"128-131\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of power supply noise tolerance of self-timed processor
We have compared the power supply noise tolerance of a synchronous processor and a self-timed processor fabricated using 0.18µm CMOS. We have designed the self-timed processor using the same RTL as the synchronous processor, and translated it into a netlist with DCVSL circuits and completion logic trees. We have demonstrated the synchronous processor shows an error rate of 9.3% for the worst power supply noise in case of 10% timing margin design. On the other hand, the self-timed processor shows 40% speed degradation, but no error, for the same power supply noise.