半导体封装激光微加工的信息物理系统

Y. Kobayashi, H. Tamaru, K. Sakaue, H. Sakurai, Kohei Shimahara, Tsubasa Endo, S. Tani
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引用次数: 0

摘要

半导体的制程规则越来越小。因此,封装中的通孔或线的尺寸和空间也变得越来越小。此外,每年发展的材料正在测试作为下一代高频电路板或累积基板的基板材料。激光微孔钻削是实现这些需求的关键技术,为了以更高的速度钻削更小的孔,人们正在大力开发输出功率更高、波长更短的激光器。另一方面,在新兴材料上钻小孔存在着重大挑战。根据参数的不同,钻孔可能会损坏孔后的铜膜或由于其自身的脆性而使材料切屑。因此,有必要根据需要的设计优化激光脉冲宽度、脉冲能量、重复频率、照射时间、波长、光束轨迹等各种加工参数,包括孔径、纵横比、节距等。目前,参数优化是通过人工试错的方式完成的,对于新材料或新设计,这可能需要几个月甚至几年的时间。可行性测试所需的时间会拖慢设计过程,也会迫使材料制造商花费大量时间检查实际使用的材料成分。
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Cyber-Physical System of laser micro processing for semiconductor package fabrication
The process rule of a semiconductor is getting smaller and smaller. Accordingly, the size of a via hole or line and space in a package is also becoming smaller. In addition, yearly evolving materials are being tested as substrate materials for the next-generation higher-frequency circuit boards or buildup substrates. The laser micro-hole drilling is a key technology for realizing these demands, and development of lasers with higher output power and shorter wavelengths is being vigorously conducted in order to drill smaller holes at higher speeds. On the other hand, significant challenges exist for drilling small holes in newly emerging materials. Depending on the parameters, drilling can damage the copper film behind the hole or chip the material due to its own brittleness. Therefore, it is necessary to optimize various processing parameters such as laser pulse width, pulse energy, repetition frequency, irradiation time, wavelength, and beam trajectory according to the required design, including hole diameter, aspect ratio, and pitch. Currently, parameter optimization is being done manually in a trial- and-error manner, which could take several months or even years for new materials or designs. The time required for feasibility testing can slow down the design process, and also forces material manufacturers to spend a great deal of time examining what kind of material composition will actually be used.
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