{"title":"全数字基带50 Mbps数据恢复使用5倍过采样与0.9数据单位间隔时钟抖动容限","authors":"Sanad Bushnaq, T. Nakura, M. Ikeda, K. Asada","doi":"10.1109/DDECS.2009.5012129","DOIUrl":null,"url":null,"abstract":"In this paper, an all digital baseband data recovery algorithm using oversampling technique is presented. Our algorithm uses 5× clock to sample incoming data once around the middle. Sampling occurs exactly on the third clock after a data edge. If no data edge sensed, sampling occurs after five clocks from the previous sample. The system is designed to receive 50 Mbps data bit rate and uses a 250 MHz local clock to do the oversampling process. After injecting the clock with jitter at various magnitudes and frequencies, the design showed around 0.9 data Unit Interval (UIdata) jitter tolerance at frequencies higher than 25 MHz, in addition to a low Bit Error Rate (BER ≪ 10−11). The setup is implemented on an Altera Stratix II GX Field Programmable Gate Array (FPGA) while Agilent 81250 parallel Bit Error Ratio Tester (parBERT) is used to measure BER using Pseudo Random Bit Sequences (PRBS). Using 0.18 µm CMOS process, the design consumes as low power as 5 µW, which makes it effective for low power applications such as wireless image sensor nodes.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"32 1","pages":"206-209"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"All digital baseband 50 Mbps data recovery using 5× oversampling with 0.9 data unit interval clock jitter tolerance\",\"authors\":\"Sanad Bushnaq, T. Nakura, M. Ikeda, K. Asada\",\"doi\":\"10.1109/DDECS.2009.5012129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, an all digital baseband data recovery algorithm using oversampling technique is presented. Our algorithm uses 5× clock to sample incoming data once around the middle. Sampling occurs exactly on the third clock after a data edge. If no data edge sensed, sampling occurs after five clocks from the previous sample. The system is designed to receive 50 Mbps data bit rate and uses a 250 MHz local clock to do the oversampling process. After injecting the clock with jitter at various magnitudes and frequencies, the design showed around 0.9 data Unit Interval (UIdata) jitter tolerance at frequencies higher than 25 MHz, in addition to a low Bit Error Rate (BER ≪ 10−11). The setup is implemented on an Altera Stratix II GX Field Programmable Gate Array (FPGA) while Agilent 81250 parallel Bit Error Ratio Tester (parBERT) is used to measure BER using Pseudo Random Bit Sequences (PRBS). Using 0.18 µm CMOS process, the design consumes as low power as 5 µW, which makes it effective for low power applications such as wireless image sensor nodes.\",\"PeriodicalId\":6325,\"journal\":{\"name\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"volume\":\"32 1\",\"pages\":\"206-209\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2009.5012129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
摘要
本文提出了一种基于过采样技术的全数字基带数据恢复算法。我们的算法使用5倍时钟在中间采样一次传入数据。采样恰好发生在数据边缘之后的第三个时钟上。如果没有检测到数据边缘,则在前一个采样的五个时钟之后进行采样。系统被设计为接收50 Mbps的数据比特率,并使用250 MHz的本地时钟进行过采样处理。在向时钟注入不同幅度和频率的抖动后,该设计在高于25 MHz的频率下显示出约0.9的数据单位间隔(UIdata)抖动容限,此外还具有较低的误码率(BER≪10−11)。该装置在Altera Stratix II GX现场可编程门阵列(FPGA)上实现,而Agilent 81250并行误码率测试仪(parBERT)使用伪随机比特序列(PRBS)测量误码率。该设计采用0.18µm CMOS工艺,功耗低至5µW,适用于无线图像传感器节点等低功耗应用。
All digital baseband 50 Mbps data recovery using 5× oversampling with 0.9 data unit interval clock jitter tolerance
In this paper, an all digital baseband data recovery algorithm using oversampling technique is presented. Our algorithm uses 5× clock to sample incoming data once around the middle. Sampling occurs exactly on the third clock after a data edge. If no data edge sensed, sampling occurs after five clocks from the previous sample. The system is designed to receive 50 Mbps data bit rate and uses a 250 MHz local clock to do the oversampling process. After injecting the clock with jitter at various magnitudes and frequencies, the design showed around 0.9 data Unit Interval (UIdata) jitter tolerance at frequencies higher than 25 MHz, in addition to a low Bit Error Rate (BER ≪ 10−11). The setup is implemented on an Altera Stratix II GX Field Programmable Gate Array (FPGA) while Agilent 81250 parallel Bit Error Ratio Tester (parBERT) is used to measure BER using Pseudo Random Bit Sequences (PRBS). Using 0.18 µm CMOS process, the design consumes as low power as 5 µW, which makes it effective for low power applications such as wireless image sensor nodes.