用x射线断层扫描分析金属粉末的高分辨率孔径

K. Heim , F. Bernier , R. Pelletier , L.-P. Lefebvre
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引用次数: 50

摘要

增材制造工艺的部署依赖于零件质量,特别是没有内部缺陷。其中一些缺陷与粉末原料中的孔隙有关。由于粉末的孔隙度通常很低,所以标准的表征技术,如比重学和金相学,不适合量化。然而,金属粉末中这种微孔的量化对于更好地了解最终部件内部缺陷的潜在来源和质量控制至关重要。分辨率为3 μm的x射线断层扫描提供了在大体积粉末中可视化孔隙的可能性,并使用图像分析程序量化其几何特征和体积分数。这种组合是独一无二的,与标准粉末表征技术相比,它展示了该方法的强大功能。结果显示了该技术的前景和局限性,取决于成像设备,材料和图像分析程序。
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High resolution pore size analysis in metallic powders by X-ray tomography

The deployment of additive manufacturing processes relies on part quality, specifically the absence of internal defects. Some of those defects have been associated with porosities in the powder feedstock. Since the level of porosity in the powder is generally very low, standard characterisation techniques such as pycnometry and metallography are not suitable for quantification. However, the quantification of such micro sized porosity in metallic powders is crucial to better understand the potential source of internal defects in final components and for quality control purposes. X-ray tomography with a 3 μm resolution offers the possibility to visualise pores in large volume of powder and to quantify their geometrical features and volume fraction using image analysis routines. This combination is unique and demonstrates the power of the approach in comparison to standard powder characterisation techniques. Results presented show the prospects and limits of this technique depending on the imaging device, material and image analysis procedure.

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Contents Editorial Board Editorial Board Contents Comparison of surface-based and image-based quality metrics for the analysis of dimensional computed tomography data
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