{"title":"提出了将部分TSC曲线重构为部分全曲线的方法，以便准确评价","authors":"Y. Kamitani, S. Maeta, M. Yoshiura, F. Yoshida","doi":"10.1109/ICSD.1998.709260","DOIUrl":null,"url":null,"abstract":"An original theory that three parameters, the energy depths of carrier traps E/sub t/, the escape frequency factor /spl nu/ and the density of carrier trap site n, can be theoretically evaluated with high accuracy from partial TSC curves is proposed. How the standard can be constructed has been a most important resultant point.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"6 1","pages":"202-205"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Proposal of reconstructing method of partial TSC curves to some full curves for accurate evaluation\",\"authors\":\"Y. Kamitani, S. Maeta, M. Yoshiura, F. Yoshida\",\"doi\":\"10.1109/ICSD.1998.709260\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An original theory that three parameters, the energy depths of carrier traps E/sub t/, the escape frequency factor /spl nu/ and the density of carrier trap site n, can be theoretically evaluated with high accuracy from partial TSC curves is proposed. How the standard can be constructed has been a most important resultant point.\",\"PeriodicalId\":13148,\"journal\":{\"name\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"volume\":\"6 1\",\"pages\":\"202-205\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1998.709260\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Proposal of reconstructing method of partial TSC curves to some full curves for accurate evaluation
An original theory that three parameters, the energy depths of carrier traps E/sub t/, the escape frequency factor /spl nu/ and the density of carrier trap site n, can be theoretically evaluated with high accuracy from partial TSC curves is proposed. How the standard can be constructed has been a most important resultant point.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
