用有限元法分析NEMS悬臂梁检测挥发性有机化合物的灵敏度

C. Jayaprakash, Dr N Siddaiah
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引用次数: 0

摘要

基于纳米机电系统(NEMS)的悬臂梁是微机电系统(MEMS)的另一种形式,其尺寸在厚度、长度和宽度等方面发生变化。尺寸变化的优势使得灵敏度和性能有了很大的提高。本文设计了一种用于挥发性有机化合物检测的阶梯式纳米反杠杆传感器。并与传统微悬臂梁进行了比较,以评估其灵敏度。通过载荷分析和应力分布分析,对不同材料的悬臂梁固定端加入纵向切割的优势进行了研究。利用COMSOL仿真软件对纳米反杠杆进行了分析,结果表明,随着纵向切割和材料类型的增加,纳米反杠杆的灵敏度有所提高,并表现出较好的灵敏度。在本研究中,我们提出了一种阶梯式悬臂结构,在静力和动力分析中使用有限元分析方法来计算各种载荷引起的挠度变化。同样,谐振频率的变化,梁的厚度的变化是用参数研究。COMSOL模拟实验结果表明,在最大应力为3.32 x10-9 N/m2时,悬臂梁的挠度灵敏度为2.85 x10-9m。从动力学分析来看,在20nm厚度处谐振频率为2.8 × 107 Hz,在30nm厚度处谐振频率为3.5 × 107 Hz。
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Sensitivity Analysis of NEMS Cantilever to Detect Volatile Organic Compounds Using Finite Element Method
Nano Electro Mechanical System (NEMS) based cantilever is the alternate form of Micro Electro Mechanical system (MEMS) with dimensional changes in perspectives like thickness, length, and width. The advantage of the dimensional change leads to great improvement in sensitivity and performance with portable structure. In this paper, a stepped nanocantilever sensor is designed for the detection of volatile organic compounds. The same is compared with the conventional micro cantilevers in order to assess the sensitivity. The advantage of incorporating longitudinal cut at fixed end of the cantilever is investigated for different materials with load analysis and stress distributed results. COMSOL Simulation software is used to perform the analysis of nanocantilever and the result shows sensitivity increased with longitudinal cut and type of material which exhibits good sensitivity. In this research, we suggest a stepped cantilever structure that uses FEM (Finite Element Method) of analysis to calculate the change in deflection owing to various loads in both static and dynamic analyses. Similarly, changes in resonance frequency for changes in beam thickness are examined using parametric study. The experimental results from COMSOL simulation are found that the displacement occurred in proposed cantilever that the deflection sensitivity 2.85 x10-9m under maximum stress of 3.32 x10-9 N/m2. From the dynamic analysis, resonant frequency occurs at 20nm thickness is 2.8x107 Hz, and at 30nm is 3.5 x 107 Hz respectively.
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来源期刊
Kuwait Journal of Science & Engineering
Kuwait Journal of Science & Engineering MULTIDISCIPLINARY SCIENCES-
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