探测介电表面上的热倏逝波

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) Pub Date : 2015-11-12 DOI:10.1109/IRMMW-THZ.2015.7327680

Y. Kajihara, T. Yokoyama, Kuan-ting Lin, Sunmi Kim

{"title":"探测介电表面上的热倏逝波","authors":"Y. Kajihara, T. Yokoyama, Kuan-ting Lin, Sunmi Kim","doi":"10.1109/IRMMW-THZ.2015.7327680","DOIUrl":null,"url":null,"abstract":"Our passive near-field microscope probes thermal evanescent waves due to local phenomena on material's surface. With the microscope, we study dielectric samples since they have surface phonon resonances whose resonance wavelengths are very close to our detection wavelength. From the results, GaAs, SiC, and AlN show reasonable signals due to thermal fluctuations, whereas GaN show very unique characteristics. In this report, we show and discuss the results.","PeriodicalId":6577,"journal":{"name":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","volume":"56 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Probing thermal evanescent waves on dielectric surfaces\",\"authors\":\"Y. Kajihara, T. Yokoyama, Kuan-ting Lin, Sunmi Kim\",\"doi\":\"10.1109/IRMMW-THZ.2015.7327680\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Our passive near-field microscope probes thermal evanescent waves due to local phenomena on material's surface. With the microscope, we study dielectric samples since they have surface phonon resonances whose resonance wavelengths are very close to our detection wavelength. From the results, GaAs, SiC, and AlN show reasonable signals due to thermal fluctuations, whereas GaN show very unique characteristics. In this report, we show and discuss the results.\",\"PeriodicalId\":6577,\"journal\":{\"name\":\"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)\",\"volume\":\"56 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2015.7327680\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2015.7327680","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

我们的被动近场显微镜探测材料表面局部现象引起的热倏逝波。在显微镜下，我们研究了介电样品，因为它们具有表面声子共振，其共振波长非常接近我们的探测波长。从结果来看，由于热波动，GaAs, SiC和AlN表现出合理的信号，而GaN表现出非常独特的特征。在本报告中，我们将展示并讨论结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Probing thermal evanescent waves on dielectric surfaces

Our passive near-field microscope probes thermal evanescent waves due to local phenomena on material's surface. With the microscope, we study dielectric samples since they have surface phonon resonances whose resonance wavelengths are very close to our detection wavelength. From the results, GaAs, SiC, and AlN show reasonable signals due to thermal fluctuations, whereas GaN show very unique characteristics. In this report, we show and discuss the results.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)

自引率

0.00%

发文量