{"title":"适用于薄膜研究的实验室EXAFS设备","authors":"J. Mimault, T. Girardeau, M. Jaouen","doi":"10.1088/0305-4608/18/9/029","DOIUrl":null,"url":null,"abstract":"The authors describe an experimental set-up which offers laboratory EXAFS facilities for thin-film characterisation. To be close to the usual transmission-mode EXAFS, they use the specular reflectivity properties of X-rays on solid surfaces. An application to the ion beam mixing of an Fe-Al multilayered sample is reported.","PeriodicalId":16828,"journal":{"name":"Journal of Physics F: Metal Physics","volume":"8 1","pages":"2121-2134"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A laboratory EXAFS facility adapted to thin-film studies\",\"authors\":\"J. Mimault, T. Girardeau, M. Jaouen\",\"doi\":\"10.1088/0305-4608/18/9/029\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe an experimental set-up which offers laboratory EXAFS facilities for thin-film characterisation. To be close to the usual transmission-mode EXAFS, they use the specular reflectivity properties of X-rays on solid surfaces. An application to the ion beam mixing of an Fe-Al multilayered sample is reported.\",\"PeriodicalId\":16828,\"journal\":{\"name\":\"Journal of Physics F: Metal Physics\",\"volume\":\"8 1\",\"pages\":\"2121-2134\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Physics F: Metal Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0305-4608/18/9/029\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Physics F: Metal Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0305-4608/18/9/029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A laboratory EXAFS facility adapted to thin-film studies
The authors describe an experimental set-up which offers laboratory EXAFS facilities for thin-film characterisation. To be close to the usual transmission-mode EXAFS, they use the specular reflectivity properties of X-rays on solid surfaces. An application to the ion beam mixing of an Fe-Al multilayered sample is reported.
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